ppa-software gatantm digitalmicrograph plug-in (Hrem Research Inc)
90
Structured Review
Hrem Research Inc
ppa-software gatantm digitalmicrograph plug-in
Ppa Software Gatantm Digitalmicrograph Plug In, supplied by Hrem Research Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/ppa-software+gatantm+digitalmicrograph+plug-in/ppa+software+gatantm+digitalmicrograph+plug+in/10__1002_slash_pssc__201084007-169-1-16
Average 90 stars, based on 1 article reviews
Ppa Software Gatantm Digitalmicrograph Plug In, supplied by Hrem Research Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/ppa-software+gatantm+digitalmicrograph+plug-in/ppa+software+gatantm+digitalmicrograph+plug+in/10__1002_slash_pssc__201084007-169-1-16
Average 90 stars, based on 1 article reviews
ppa-software gatantm digitalmicrograph plug-in - by Bioz Stars,
2026-10
90/100 stars
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other:Article Title: Nano-beam electron diffraction evaluation of strain behaviour in nano-scale patterned strained silicon-on-insulator Article Snippet: A major challenge for the application of strain engineering to enhance the performance of electronic devices is the quantification of strain on the nanoscale.. Besides other techniques (Raman spectroscopy, X-ray diffraction) electron beam techniques allow strain analyses with a spatial resolution of a few nanometers and a reasonable strain sensitivity of 1x10 (relative to the lattice constant of silicon).. In the present work, we address practical issues in the application of nano-beam electron diffraction (NBED) to probe the strain in strained silicon layers and sub-100 nm structures. |